发明名称 INTELLIGENT ELECTRONIC DEVICE RESPONSE TIME PERFORMANCE OPTIMIZATION APPARATUSES
摘要 The INTELLIGENT ELECTRONIC DEVICE RESPONSE TIME PERFORMANCE OPTIMIZATION APPARATUSES (“IEDP”) transform Intelligent Electronic Device (IED) substation designs and arrangements comprising one or more IED profiles, a plurality of input factors or configurations values, and a set of stimuli triggers using IEDP components into estimated and predicted performance metrics' values. In some implementations, the disclosure provides a processor-implemented method for determining one or more expected performance values of a substation automation system in non-emulated scenarios. The determined performance values allow substation designers to build reliable solutions tested under typical and atypical scenarios. Additionally the IEDP provides optimization tools to improve a substation design with respect to one or more performance metrics.
申请公布号 US2016156184(A1) 申请公布日期 2016.06.02
申请号 US201514951441 申请日期 2015.11.24
申请人 SCHNEIDER ELECTRIC INDUSTRIES SAS 发明人 SHARMA Mayank;Jardim Mario Roberto
分类号 H02J3/00;G05B13/04;G06F17/18 主分类号 H02J3/00
代理机构 代理人
主权项 1. A processor implemented method for determining an expected overall performance value of a substation automation system in non-emulated scenarios, comprising: providing, via a computer, a plurality of virtual Intelligent Electronic Device (IED) representations, wherein each virtual IED representation is associated with a respective data structure defining a previously generated physical IED performance profile, wherein the performance profile is generated using emulated stimuli transmitted to a physical IED in at least one configuration state; obtaining, via a processor, an arrangement design of the provided plurality of virtual IED representations, wherein the arrangement corresponds to an untested contemplated substation automation system configuration; receiving arrangement stimulation test values, wherein the arrangement stimulation test values are comprised of a designation of emulated stimuli triggers and a designation of emulated input factors for use in profiling the arrangement design under a plurality of stress conditions; determining an expected overall performance value of the arrangement as a function of performance metrics for each of the virtual IED representations in the arrangement in accordance with the arrangement, the performance metric for each of the virtual IED representations being retrieved from the respective data structure defining the previously generated physical IED performance profile by addressing the data structure using the arrangement stimulation test values.
地址 Rueil-Malmaison FR