| 摘要 |
PROBLEM TO BE SOLVED: To make it harder for an element whose bias potential is controlled and which is exposed to severe electric stress and thermal stress to have a failure by delaying a decrease in performance.SOLUTION: A state in which a reference value of stress is exceeded or a state in which a reference value of deterioration is exceeded is detected, and a state of bias control and a state of no bias control are switched in a block of circuits put together for any kind of FET such as a planar type FET, a fin type FET, etc., so as to cancel a state of bias control according to a situation.SELECTED DRAWING: Figure 1 |
