发明名称 MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
摘要 A sensor system includes a microelectromechanical systems (MEMS) sensor, control circuit, signal evaluation circuitry, a digital to analog converter, signal filters, an amplifier, demodulation circuitry and memory. The system is configured to generate high and low-frequency signals, combine them, and provide the combined input signal to a MEMS sensor. The MEMS sensor is configured to provide a modulated output signal that is a function of the combined signal. The system is configured to demodulate and filter the modulated output signal, compare the demodulated, filtered signal with the input signal to determine amplitude and phase differences, and determine, based on the amplitude and phase differences, various parameters of the MEMS sensor. A method for determining MEMS sensor parameters is also provided.
申请公布号 US2016152464(A1) 申请公布日期 2016.06.02
申请号 US201615017786 申请日期 2016.02.08
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 SESSEGO RAIMONDO P.;DAR Tehmoor M.;DEBEURRE Bruno J.
分类号 B81B3/00 主分类号 B81B3/00
代理机构 代理人
主权项
地址 AUSTIN TX US