| 摘要 |
The present invention relates to a handler for testing an electronic component. The handler for testing an electronic component, according to the present invention, is provided with a cooling pocket in a pushing head of a connection unit, which electrically connects the electronic component to a test socket of a tester, and has a fluid supplier for supplying cooling fluid to the inside of the cooling pocket. According to the present invention, since the temperature required for testing the electronic component can be maintained by the cooling fluid supplied to the inside of the cooling pocket, test reliability is improved. |
