发明名称 Set of Stepped Surfaces Formation for a Multilevel Interconnect Structure
摘要 A trench can be formed through a stack of alternating plurality of first material layers and second material layers. A dielectric material liner and a trench fill material portion can be formed in the trench. The dielectric material liner and portions of first material layer can be simultaneously etched to form laterally-extending cavities having level-dependent lateral extents. A set of stepped surfaces can be formed by removing unmasked portions of the second material layers. Alternately, an alternating sequence of processing steps including vertical etch processes and lateral recess processes can be employed to laterally recess second material layers and to form laterally-extending cavities having level-dependent lateral extents. Lateral cavities can be simultaneously formed in multiple levels such that levels having laterally-extending cavities of a same lateral extent are offset across multiple integrated cavities.
申请公布号 WO2016085581(A1) 申请公布日期 2016.06.02
申请号 WO2015US55374 申请日期 2015.10.13
申请人 SANDISK TECHNOLOGIES, INC. 发明人 HIRONAGA, NOBUO;SHIMABUKURO, SEIJI;IUCHI, HIROAKI;SANO, MICHIAKI;TAKEGUCHI, NAOKI
分类号 H01L27/115 主分类号 H01L27/115
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