发明名称 |
OPERATIING METHOD OF NONVOLATILE MEMORY SYSTEM |
摘要 |
The present invention relates to a method for operating a nonvolatile memory system, to enhance the reliability of detecting an optimal read voltage. According to one embodiment of the present invention, the method comprises the following steps: detecting the number of on-cells of memory cells on the basis of a start sampling voltage; comparing the detected number of on-cells with a reference value; setting sampling voltages on the basis of the comparison result; performing a sampling operation on the memory cells on the basis of the sampling voltages; and detecting an optimal read voltage to discriminate any one of program states on the basis of the result of the sampling operation. |
申请公布号 |
KR20160062298(A) |
申请公布日期 |
2016.06.02 |
申请号 |
KR20140164546 |
申请日期 |
2014.11.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, KWANG HOON;YOO, YOUNG GEON;KONG, JUN JIN |
分类号 |
G11C16/34;G11C16/26 |
主分类号 |
G11C16/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|