Automated Test Equipment, Instruction Provider for Providing a Sequence of Instructions, Method of Providing Signal to a Device Under Test, Method for Providing a Sequence of Instructions and Test System

摘要

An automated test equipment includes a test processor configured to provide a signal to a device under test on the basis of a sequence of instructions defining an evaluation of test vectors. The test processor is configured to map a test vector onto a set of signal states or signal transitions. Furthermore, the test processor is configured to variably select a number of signal states or signal transitions provided in the signal based on a current test vector in dependence on a current instruction.

主权项

1. An automated test equipment, comprising:
a test processor configured to provide a signal to a device under test on the basis of a sequence of instructions defining an evaluation of test vectors; wherein the test processor is configured to map a test vector onto a set of signal states or signal transitions; and wherein the test processor is configured to variably select a number of signal states or signal transitions provided in the signal based on a current test vector in dependence on a current instruction; wherein each test vector is mapped onto a fixed number of signal states or signal transitions; and wherein the test processor is configured to select the number of signal states or signal transitions of the current test vector to be provided in the signal in dependence on the current instruction.