BLOCKING THE EFFECTS OF SCAN CHAIN TESTING UPON A CHANGE IN SCAN CHAIN TOPOLOGY

摘要

A system comprises a plurality of components, scan chain selection logic coupled to the components, and override selection logic coupled to the scan chain selection logic. The scan chain selection logic selects various of the components to be members of a scan chain under the direction of a host computer. The override selection logic detects a change in the scan chain and, as a result, blocks the entire scan chain from progressing.

主权项

1. A system on a chip comprising:
(a) a communications link including a serial test data in lead and a serial test data out lead; (b) a port coupled to the communications link including the serial test data in lead and the serial test data out lead, and having a chip serial test data in lead, a chip serial test data out lead, a select output lead, and a master override input; (c) a first component separate from the port, the first component including an embedded TAP controller, the first component having a test data input coupled to the chip serial test data in lead, a component serial test data output lead, and an override output lead; (d) override selection logic having an input connected to the select output lead, an input connected to the override output lead, and a master override output lead coupled to the master override input of the port; (e) multiplexer circuitry having a first input coupled to the chip serial test data in lead, a second input coupled to the component serial test data output, an output, and a control input; and (f) gating circuitry having a first input connected to the select output lead, a second input connected to the master override output lead, and an output connected to the control input of the multiplexer circuitry, the gating circuitry being free of a connection to the override output of the first component.