发明名称 PHOTORESIST REMOVAL
摘要 Disclosed herein is a composition and method for semiconductor processing. In one embodiment, a wet-cleaning composition for removal of photoresist is provided. The composition comprises a strong base; an oxidant; and a polar solvent. In another embodiment, a method for removing photoresist is provided. The method comprises the steps of applying a wet-cleaning composition comprising about 0.1 to about 30 weight percent strong base; about one to about 30 weight percent oxidant; about 20 to about 95 weight percent polar solvent; and removing the photoresist.
申请公布号 US2016152926(A1) 申请公布日期 2016.06.02
申请号 US201615018113 申请日期 2016.02.08
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 Minsek David W.;Rath Melissa K.;Bernhard David D.;Baum Thomas H.
分类号 C11D3/30;H01L21/02;C11D1/72;C11D11/00;C11D7/32;C11D7/34 主分类号 C11D3/30
代理机构 代理人
主权项
地址 Danbury CT US