发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 The present invention relates to a manufacturing method of a semiconductor device, which can reduce the generation of particles. The manufacturing method of a semiconductor device includes the following steps: washing the inside of a chamber with a washing gas containing fluorine; forming a complex seasoning layer having a structure, where a silicon nitride film and a silicon oxide film are stacked, inside the chamber; and forming a target film on a substrate arranged inside the chamber.
申请公布号 KR20160062370(A) 申请公布日期 2016.06.02
申请号 KR20140164949 申请日期 2014.11.25
申请人 WONIK IPS CO., LTD. 发明人 LIM, SUK KYU;KIM, SUN IL;KIM, KYUNG HWAN;CHOI, YOUNG CHUL
分类号 H01L21/302;H01L21/20 主分类号 H01L21/302
代理机构 代理人
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