发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
The present invention relates to a manufacturing method of a semiconductor device, which can reduce the generation of particles. The manufacturing method of a semiconductor device includes the following steps: washing the inside of a chamber with a washing gas containing fluorine; forming a complex seasoning layer having a structure, where a silicon nitride film and a silicon oxide film are stacked, inside the chamber; and forming a target film on a substrate arranged inside the chamber. |
申请公布号 |
KR20160062370(A) |
申请公布日期 |
2016.06.02 |
申请号 |
KR20140164949 |
申请日期 |
2014.11.25 |
申请人 |
WONIK IPS CO., LTD. |
发明人 |
LIM, SUK KYU;KIM, SUN IL;KIM, KYUNG HWAN;CHOI, YOUNG CHUL |
分类号 |
H01L21/302;H01L21/20 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|