发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a structure for a semiconductor device with the reduced number of selection gates per one columnar semiconductor layer.SOLUTION: A structure for a semiconductor device comprises: a first selection gate insulating film surrounding a first columnar semiconductor layer; a first selection gate surrounding the first selection gate insulating film; a first bit line connected with an upper part of the first columnar semiconductor layer; a layer having a first charge storage layer surrounding a second columnar semiconductor layer; a first control gate surrounding the layer; a layer having a second charge storage layer surrounding the second columnar semiconductor layer formed above the first control gate; a second control gate surrounding the layer; and a first lower inner wire connecting between lower parts of the first and second columnar semiconductor layers. Further, the structure comprises a third charge storage layer, a third control gate, a layer having a fourth charge storage layer, a fourth control gate, a second selection gate insulating film, a second selection gate, a first source line connected with an upper part of a fourth columnar semiconductor layer, and a second lower inner wire connecting between lower parts of the third and fourth columnar semiconductor layers.
申请公布号 JP5928963(B2) 申请公布日期 2016.06.01
申请号 JP20140263131 申请日期 2014.12.25
申请人 ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. 发明人 舛岡 富士雄;中村 広記
分类号 H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/336
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