| 摘要 |
Disclosed is an interface apparatus connecting semiconductor devices and a test installation. The apparatus includes: an interface board electrically connecting semiconductor devices and a test installation; a power supply unit disposed adjacent to the interface board and applying power required to test the semiconductor devices to the semiconductor devices through the interface board according to a control signal provided from the test installation; and power channels connecting the interface board and the power supply unit. According to one embodiment of the present invention, the interface apparatus can safely supply power to the semiconductor devices for testing the semiconductor devices. |
