发明名称 Sub-saturated atomic layer deposition and conformal film deposition
摘要 Methods and apparatus for depositing continuous thin films using plasma-activated sub-saturated atomic layer deposition are provided herein. According to various embodiments, pin-hole free continuous films may be deposited at thicknesses thinner than achievable with conventional methods. The methods and apparatus also provide high degree of thickness control, with films a per-cycle thickness tunable to as low as 0.1 Å in some embodiments. Further, the methods and apparatus may be used to provide films having improved properties, such as lower wet etch rate, in some embodiments.
申请公布号 US9355839(B2) 申请公布日期 2016.05.31
申请号 US201314061587 申请日期 2013.10.23
申请人 Lam Research Corporation 发明人 Swaminathan Shankar;Kang Hu;Lavoie Adrien
分类号 H01L21/02;C23C16/455;H01L21/311 主分类号 H01L21/02
代理机构 Weaver Austin Villeneuve & Sampson LLP 代理人 Weaver Austin Villeneuve & Sampson LLP
主权项 1. A method for depositing a conformal film on a substrate surface, the method comprising: providing a substrate comprising topographical features in a reaction chamber; introducing a first reactant in vapor phase into the reaction chamber under conditions allowing the first reactant to adsorb onto the substrate surface; introducing a dose of a second reactant in vapor phase into the reaction chamber for a dose time wherein the dose of the second reactant is a sub-saturated dose; and periodically exposing the substrate surface to plasma when the dose of the second reactant has ceased to drive a surface reaction between the first and second reactants on the substrate surface to form the film such that it conforms to the topographical features.
地址 Fremont CA US