| 发明名称 | Gapless pattern detection circuit and semiconductor device including the same | ||
| 摘要 | A semiconductor device that includes: a detection circuit suitable for detecting a gapless pattern section of a detection target signal; and an internal circuit suitable for performing a normal operation during a normal section and additionally performing the normal operation during a compensating section corresponding to the gapless pattern section in response to a detection result signal outputted from the detection circuit. | ||
| 申请公布号 | US9355707(B2) | 申请公布日期 | 2016.05.31 |
| 申请号 | US201414455624 | 申请日期 | 2014.08.08 |
| 申请人 | SK Hynix Inc. | 发明人 | Jung Ho-Don |
| 分类号 | G11C7/00;G11C11/4091;G11C11/4093;G11C7/08;G11C7/10;G11C11/4076 | 主分类号 | G11C7/00 |
| 代理机构 | IP & T Group LLP | 代理人 | IP & T Group LLP |
| 主权项 | 1. A semiconductor device, comprising: a detection circuit suitable for detecting a gapless pattern section in which a detection target signal sequentially toggles without a time-gap; and an internal circuit suitable for performing a normal operation during a normal section and additionally performing the normal operation during a compensating section corresponding to the gapless pattern section in response to a detection result signal outputted from the detection circuit. | ||
| 地址 | Gyeonggi-do KR | ||