发明名称 System test apparatus
摘要 The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.
申请公布号 US9354996(B2) 申请公布日期 2016.05.31
申请号 US201113704490 申请日期 2011.03.15
申请人 Hyundai Motor Company;Kia Motors Corporation;Ehwa University Industry Collaboration Foundation 发明人 Choi Byoung Ju;Seo Joo Young;Yang Sueng Wan;Lim Jin Yong;Kim Young Su;Oh Jung Suk;Kwon Hae Young;Jang Seung Yeun
分类号 G06F11/26;G06F11/36 主分类号 G06F11/26
代理机构 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. 代理人 Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. ;Corless Peter F.
主权项 1. A system test apparatus for a system comprising a plurality of processes and a process control block including run-time execution information about the plurality of processes during run-time conditions of the system, the system test apparatus comprising: an insertion module configured to insert a test agent into the process control block based on a list of processes that are operating in the system while the system operates; a hooking module configured to hook a test target to a test code in such a manner that the test agent executes the test code including an operation of an original code instead of functions of the plurality of processes, when an event related to the test target occurs among the plurality of processes; a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked to the test code; a logging module configured to store the pieces of test information collected by the scanning module; and an analysis apparatus configured to analyze the pieces of collected test information.
地址 Seoul KR