发明名称 |
Inspection having a segmented pupil |
摘要 |
A method and an apparatus that may include optics that is arranged to illuminate a surface of a sample with radiation and to collect reflected radiation from the surface of the sample; wherein the optics includes a pupil that has multiple pupil segments that correspond to different angular regions of collection or illumination; and a detection module arranged to receive the reflected radiation and generate, for each pupil segment, pupil segment detection signals. |
申请公布号 |
US9354212(B2) |
申请公布日期 |
2016.05.31 |
申请号 |
US201414149645 |
申请日期 |
2014.01.07 |
申请人 |
APPLIED MATERIALS ISRAEL LTD. |
发明人 |
Berlatzky Yoav;Shoham Amir;Dolev Ido |
分类号 |
G06K9/00;G01N33/00;G01N21/88 |
主分类号 |
G06K9/00 |
代理机构 |
Kilpatrick Townsend & Stockton LLP |
代理人 |
Kilpatrick Townsend & Stockton LLP |
主权项 |
1. An apparatus comprising:
optics arranged to illuminate a surface of a sample and to collect radiation from the surface of the sample, the optics comprising:
a pupil having multiple pupil segments that correspond to different angular regions of collection or illumination; andoptical components configured to direct radiation from or to different pupil segments to different directions; a detection module arranged to receive the radiation from or to the different pupil segments and generate an image of the sample for each corresponding pupil segment; and an image processor arranged to:
obtain a difference image by subtracting a first image corresponding to a first pupil segment from a second image corresponding to a second pupil segment to provide gradient of phase information associated with the surface of the sample; andintegrate the difference image to provide a phase map of the surface of the sample. |
地址 |
Rehovot IL |