发明名称 Calibrating thermal behavior of electronics
摘要 A method includes determining a relationship between indirect thermal data for a processor and a measured temperature associated with the processor, during a calibration process, obtaining the indirect thermal data for the processor during actual operation of the processor, and determining an actual significant temperature associated with the processor during the actual operation using the indirect thermal data for the processor during actual operation of the processor and the relationship.
申请公布号 US9354126(B2) 申请公布日期 2016.05.31
申请号 US201213691145 申请日期 2012.11.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Chainer Timothy J.;Parida Pritish R.;Schultz Mark D.
分类号 G01K15/00;G01K13/00;G01K1/12;G01K3/00;G01K7/42 主分类号 G01K15/00
代理机构 Otterstedt, Ellenbogen & Kammer, LLP 代理人 Morris Daniel P.;Otterstedt, Ellenbogen & Kammer, LLP
主权项 1. A method comprising the steps of: determining a relationship between indirect thermal data for at least a first processor and a measured temperature associated with said at least first processor, during a calibration process; obtaining said indirect thermal data for said at least first processor during actual operation of said at least first processor; determining an actual significant temperature associated with said at least first processor during said actual operation using said indirect thermal data for said at least first processor during actual operation of said at least first processor and said relationship; determining a relationship between indirect thermal data for at least a second processor and a measured temperature associated with said at least second processor, during said calibration process, said at least first and second processors being collocated; obtaining said indirect thermal data for said at least second processor during actual operation of said at least second processor; and determining an actual significant temperature associated with said at least second processor during said actual operation of said at least first and second processors using said indirect thermal data for said at least second processor during actual operation of said at least second processor and said relationship between said indirect thermal data for said at least second processor and said measured temperature associated with said at least second processor.
地址 Armonk NY US