发明名称 |
Memory system comprising nonvolatile memory device and method of adjusting read voltage based on sub-block level program and erase status |
摘要 |
A method of operating a nonvolatile memory device configured to erase a memory block in sub-block units comprises detecting state information of unselected sub-blocks associated with a selected sub-block comprising selected memory cells, adjusting a read bias of the selected memory cells based on the state information, and reading data from the selected memory cells according to the adjusted read bias. The state information indicates a number of the unselected sub-blocks having a programmed state or an erased state. |
申请公布号 |
US9355724(B2) |
申请公布日期 |
2016.05.31 |
申请号 |
US201314076299 |
申请日期 |
2013.11.11 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Oh Eun Chu;Kong Junjin;Son Hong Rak |
分类号 |
G11C16/04;G11C11/56;G11C16/26;G11C16/16;G11C16/14 |
主分类号 |
G11C16/04 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A method of operating a nonvolatile memory device configured to erase a memory block in sub-block units, comprising:
detecting a state information of unselected sub-blocks associated with a selected sub-block comprising selected memory cells; adjusting a read bias of the selected memory cells based on the state information; and reading data from the selected memory cells according to the adjusted read bias, wherein the state information indicates a number of the unselected sub-blocks having a programmed state or an erased state. |
地址 |
Suwon-si, Gyeonggi-do KR |