发明名称 Memory system comprising nonvolatile memory device and method of adjusting read voltage based on sub-block level program and erase status
摘要 A method of operating a nonvolatile memory device configured to erase a memory block in sub-block units comprises detecting state information of unselected sub-blocks associated with a selected sub-block comprising selected memory cells, adjusting a read bias of the selected memory cells based on the state information, and reading data from the selected memory cells according to the adjusted read bias. The state information indicates a number of the unselected sub-blocks having a programmed state or an erased state.
申请公布号 US9355724(B2) 申请公布日期 2016.05.31
申请号 US201314076299 申请日期 2013.11.11
申请人 Samsung Electronics Co., Ltd. 发明人 Oh Eun Chu;Kong Junjin;Son Hong Rak
分类号 G11C16/04;G11C11/56;G11C16/26;G11C16/16;G11C16/14 主分类号 G11C16/04
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A method of operating a nonvolatile memory device configured to erase a memory block in sub-block units, comprising: detecting a state information of unselected sub-blocks associated with a selected sub-block comprising selected memory cells; adjusting a read bias of the selected memory cells based on the state information; and reading data from the selected memory cells according to the adjusted read bias, wherein the state information indicates a number of the unselected sub-blocks having a programmed state or an erased state.
地址 Suwon-si, Gyeonggi-do KR