发明名称 |
Spectrophotometer including photodiode array |
摘要 |
A spectrophotometer in which a normal plane to a diffraction grating is inclined with respect to an optical axis of an incident light passing through a slit, the normal plane to the diffraction grating passing through an intersection point between the optical axis of the incident light i and a grating surface of the diffraction grating. The diffraction grating and a photodiode array PDA are placed such that the photodiode array PDA is parallel to the normal plane to the diffraction grating and that a normal plane to the photodiode array PDA includes a line that is symmetrical to the optical axis of the incident light i about the normal plane to the diffraction grating. |
申请公布号 |
US9354114(B2) |
申请公布日期 |
2016.05.31 |
申请号 |
US201314083664 |
申请日期 |
2013.11.19 |
申请人 |
SHIMADZU CORPORATION |
发明人 |
Gunji Masahide |
分类号 |
G01J3/28;G01J3/18;G01J3/02;G01N30/74;G01N21/3577;G01N21/85 |
主分类号 |
G01J3/28 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. A spectrophotometer comprising:
a) a slit; b) a diffraction grating which wavelength-disperses an incident light passing through the slit; and c) a photodiode array including a plurality of light intensity measurement elements arranged in a direction of the wavelength dispersion by the diffraction grating, wherein a first plane which is perpendicular to a grating line and passes through an intersection point between an optical axis of the incident light and a grating surface of the diffraction grating is not coincident with a second plane which is perpendicular to surfaces of the light intensity measurement elements and passes through a central line of the photodiode array; wherein the central line of the photodiode array is a line connecting centers of the plurality of light intensity measurement elements. |
地址 |
Kyoto JP |