发明名称 |
DETECTION METHOD FOR REFLECTED LIGHT AND LASER PROCESSING HEAD |
摘要 |
PROBLEM TO BE SOLVED: To provide a reflected-light detection method which enables a ratio of the maximum value to the minimum value of an A/D count value of an amount of light in reflected light from a laser processing position to be kept low and a laser processing head.SOLUTION: A reflected-light detection method for detecting reflected light RLB from a laser processing position WP when laser processing is to be performed by condensing laser light oscillated from a laser oscillator with a condenser lens that a laser processing head has to irradiate a workpiece enables reflected light in a wavelength band with a large amount of reflected light in reflected light RLB from a laser processing position WP to be shielded by a filter 7 that the laser processing head 1 has to make a reflected-light detector 9 that the laser processing head 1 has detect reflected light in a wavelength band with a small amount of reflected light having penetrated through the filter 7. A range of wavelengths of reflected light that the filter 7 transmits is a range of about 550 nm-811 nm that is a range which keeps the ratio of maximum value/minimum value of an A/D count value of an amount of visible light to 3 or less.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016097407(A) |
申请公布日期 |
2016.05.30 |
申请号 |
JP20140233328 |
申请日期 |
2014.11.18 |
申请人 |
AMADA HOLDINGS CO LTD |
发明人 |
IWASAKI JUN;MIYOSHI HIRONOBU;MIYAMOTO YOSHIHISA |
分类号 |
B23K26/00;G01J1/42 |
主分类号 |
B23K26/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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