发明名称 TEST TRAY FOR TEST HANDLER AND INTERFACE BOARD FOR TESTER
摘要 The present invention relates to a test tray for a test handler and an interface board for a tester. According to the present invention, a secondary calibration hole is additionally formed in an insert of the test tray and a secondary calibration pin is provided in a socket guider of the interface board. In addition, an alignment hole is additionally formed in a test socket of the interface board and an alignment pin is provided in the interface board. Accordingly, a position of the insert can be calibrated in divided steps. Furthermore, a wall surface forming a calibration hole of an insert body is cut, and an incision hole is formed around the calibration hole. According to the present invention, since the position of the insert is calibrated sequentially in the divided steps, it is possible to calibrate the position of the insert with greater accuracy. Additionally, since the calibration pin is prevented from being fitted into the calibration hole, formation of a smaller calibration hole and finer calibration of the position of the insert are enabled.
申请公布号 KR20160060546(A) 申请公布日期 2016.05.30
申请号 KR20150146230 申请日期 2015.10.20
申请人 TECHWING, INC. 发明人 NA, YUN SUNG;HWANG, JUNG WOO;CHOI, HEE JUN
分类号 G01R31/28;G01R1/04;G01R31/26 主分类号 G01R31/28
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