发明名称 SPECIMEN MEASUREMENT DEVICE AND SPECIMEN MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a specimen measurement device and a specimen measurement method which can improve the efficiency of processing specimens.SOLUTION: A specimen measurement device 10 includes: a processing section 14 for sucking specimens in specimen containers 100 so as to measure the specimens; a transfer section 12 which includes a holding section 12a for holding the specimen containers 100 and which takes out the specimen containers 100 from a rack 200 capable of storing the specimen containers 100 at a plurality of storage positions 211 to 220 side by side so as to transfer them to the processing section 14; and a detection section 13 which is attached to the holding section 12a in a manner to be movable integrally with the holding section 12a and which detects the presence or absence of the specimen containers 100 at the storage positions 211 to 220.SELECTED DRAWING: Figure 1
申请公布号 JP2016095251(A) 申请公布日期 2016.05.26
申请号 JP20140232239 申请日期 2014.11.14
申请人 SYSMEX CORP 发明人 YAMAZAKI ATSUO;OKAZAKI TOMONORI;NAKANISHI TOSHIJI;SAINO TAKAHIRO
分类号 G01N35/04;G01N35/02 主分类号 G01N35/04
代理机构 代理人
主权项
地址