发明名称 PARTICLE ANALYZING DEVICE AND PARTICLE ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a particle analyzing device that reduces noise on a signal obtained on the basis of light emitted from particles that went through light irradiation.SOLUTION: A particle analyzing device includes: a first irradiation unit for irradiating first light to particles passing through a channel at a first position on the channel; a second irradiation unit for irradiating second light to the particles at a second position downstream of the first position; a light detection unit for obtaining an optical signal emitted by the particles and outputting a voltage signal; and a signal processing unit for determining an acquisition point on the basis of the time axis of a second voltage signal output by the light detection unit on the basis of the second light irradiation by the second irradiation unit on the basis of a first voltage signal output on the basis of the first light irradiation by the first irradiation unit and flow rate of the particles.SELECTED DRAWING: Figure 2
申请公布号 JP2016095221(A) 申请公布日期 2016.05.26
申请号 JP20140231291 申请日期 2014.11.14
申请人 SONY CORP 发明人 TAWARA KATSUTOSHI
分类号 G01N15/14 主分类号 G01N15/14
代理机构 代理人
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