发明名称 X-RAY INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of detecting X-rays in a wide energy band at reduced manufacturing cost.SOLUTION: An X-ray inspection apparatus includes an X-ray irradiator, a line sensor assembly 14, and the like. The line sensor assembly 14 includes a plurality of detection units 41 among other things. Each detection unit 41 includes a scintillator 53, a detector body 52 including a plurality of elements disposed thereon, and a ceramic substrate 51 supporting them. In the line sensor assembly 14, the plurality of detection units 41 are arrayed in a front-back direction such that the scintillator 53 and detector body 52 of each detection unit 41 is arranged without a gap with the scintillator 53 and detector body 52 of an adjacent detection unit 41.SELECTED DRAWING: Figure 5
申请公布号 JP2016095248(A) 申请公布日期 2016.05.26
申请号 JP20140232130 申请日期 2014.11.14
申请人 ISHIDA CO LTD 发明人 SUHARA KAZUHIRO
分类号 G01N23/04;G01N23/083;G01T1/20 主分类号 G01N23/04
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