发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a Schottky barrier diode which has high breakdown voltage and less reverse leakage current and high ESD resistance.SOLUTION: A Schottky barrier diode which passes current in a vertical direction comprises a plurality of cylindrical P-type diffusion layers or a plurality of spherical P-type diffusion layers, which are embedded in N-type silicon and under a p-type guard ring in a stripe shape, and a distance between the plurality of rows of embedded P-type diffusion layers increases with distance from an anode side toward a cathode side. The plurality of spherical P-type diffusion layers under the guard ring can produce an effect similar to that produced by the plurality of cylindrical P-type diffusion layers.SELECTED DRAWING: Figure 4
申请公布号 JP2016096165(A) 申请公布日期 2016.05.26
申请号 JP20140229390 申请日期 2014.11.12
申请人 SANKEN ELECTRIC CO LTD 发明人 MORIKAWA NAOKI;CHEN YI
分类号 H01L29/872;H01L29/06;H01L29/47 主分类号 H01L29/872
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