I-V CHARACTERISTIC MEASUREMENT DEVICE, I-V CHARACTERISTIC MEASUREMENT METHOD AND PROGRAM FOR I-V CHARACTERISTIC MEASUREMENT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an I-V characteristic measurement device, an I-V characteristic measurement method and a program for an I-V characteristic measurement device, capable of obtaining more measurement chances than conventional art while maintaining a sufficient accuracy even in a measurement by the solar light at outdoors.SOLUTION: An I-V characteristic measurement device includes: an I-V tester 1 measuring I-V characteristics of a solar cell of a measuring object by sweeping a voltage to the solar cell; and a plurality of illuminance sensors 21, 22; a coincidence degree calculation part 33 calculating the coincidence degree of illuminance measurement values measured by the plurality of illuminance sensors 21, 22; and a determination part 34 determining that I-V characteristics measured by the I-V tester 1 is a true value if the coincidence degree is within a predetermined allowable range.SELECTED DRAWING: Figure 1