DETERMINATION OF ELECTRONIC CIRCUIT ROBUSTNESS

摘要

Technologies are generally described that relate to analysis of circuits and that facilitate determination of electronic circuit robustness. An example method includes performing, for a cell device by a unit including a processor, statistical analysis to obtain statistical information for the cell device that is indicative of a robustness of the cell device. The robustness of the cell device pertains to a parameter variation of the cell device that is related to a noise of the cell device. The method also includes determining a characteristic of the cell device based on the statistical information.

主权项

1. A method, comprising:
performing, for a cell device by a unit comprising a processor, statistical analysis to obtain statistical information for the cell device that is indicative of a robustness of the cell device, wherein the robustness of the cell device pertains to a parameter variation of the cell device that is related to a noise of the cell device; determining a characteristic of the cell device based on the statistical information; and associating the characteristic of the cell device with statistical noise margin information for the cell device, wherein the associating comprises storing the characteristic in a data store that stores statistical noise margin information for the cell device.