发明名称 COMPOUND, RESIN, RESIST COMPOSITION, AND PRODUCTION METHOD OF RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern with fewer defects and good line edge roughness can be produced.SOLUTION: The resist composition comprises a resin (A1) having an acid-labile group, a resin (A2) having a structural unit represented by formula (I), and an acid generator. In the formula, Rrepresents a hydrogen atom, a halogen atom, or an alkyl group having 1 to 6 carbon atoms which may have a halogen atom; Rrepresents a fluorinated saturated hydrocarbon group having 1 to 12 carbon atoms; and Arepresents an alkanediyl group having 2 to 6 carbon atoms or *-A-X-(A-X)-A-, where * represents a bond in -O-CO- with an oxygen atom.SELECTED DRAWING: None
申请公布号 JP2016095509(A) 申请公布日期 2016.05.26
申请号 JP20150217452 申请日期 2015.11.05
申请人 SUMITOMO CHEMICAL CO LTD 发明人 OCHIAI MITSUYOSHI;NAKANO SHOTA;ICHIKAWA KOJI
分类号 G03F7/039;C08F220/24;G03F7/004;G03F7/038 主分类号 G03F7/039
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