发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology for further improving withstanding voltage characteristics, in a semiconductor device having a semiconductor region that facilitates extension of a depletion layer at a side part and a bottom part of a trench.SOLUTION: Provided is a semiconductor device having a gate insulating layer and a gate electrode in a trench. A step is formed on a lateral face of the trench. The lateral face of the trench has an upper lateral face and a lower lateral face. The surface of the step is inclined so as to be displaced downward as it goes to the center side of the trench. The semiconductor substrate has: a first region of a first conductivity type contacted with the gate insulating layer at the upper lateral face; a body region of a second conductivity type contacted with the gate insulating layer at the upper lateral face at a lower side in the first region; a second region of the first conductivity type contacted with the gate insulating layer at the upper lateral face and the lower lateral face at a lower side of the body region; a side region of the second conductivity type contacted with the gate insulating layer at the lower lateral face; and a bottom region of the second conductivity type contacted with the gate insulating layer at a bottom face of the trench.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016096288(A) |
申请公布日期 |
2016.05.26 |
申请号 |
JP20140232461 |
申请日期 |
2014.11.17 |
申请人 |
TOYOTA MOTOR CORP;DENSO CORP;TOYOTA CENTRAL R&D LABS INC |
发明人 |
TAKATANI HIDESHI;MIYAHARA SHINICHIRO;KUCHIKI KATSUHIRO;AOI SACHIKO |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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