发明名称 |
RESISTIVE RANDOM ACCESS MEMORY STRUCTURE AND METHOD FOR OPERATING RESISTIVE RANDOM ACCESS MEMORY |
摘要 |
A resistive random access memory (RRAM) structure including a first transistor, a second transistor and a RRAM cell string is provided. The first transistor and the second transistor are cascaded by electrically connecting a first terminal of the first transistor and the second transistor. The RRAM cell string includes a plurality of memory cells connected with each other and is electrically connected to a second terminal of the first transistor. |
申请公布号 |
US2016148978(A1) |
申请公布日期 |
2016.05.26 |
申请号 |
US201514601252 |
申请日期 |
2015.01.21 |
申请人 |
Powerchip Technology Corporation |
发明人 |
Hsu Mao-Teng |
分类号 |
H01L27/24;G11C13/00 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
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主权项 |
1. A resistive random access memory structure, comprising:
a first transistor and a second transistor, wherein the first transistor and the second transistor are cascaded by electrically connecting a first terminal of the first transistor with the second transistor; and a resistive random access memory cell string, comprising a plurality of memory cells electrically connected to each other, and electrically connected to a second terminal of the first transistor. |
地址 |
Hsinchu TW |