发明名称 |
PATTERN WAFER FOR LEDS, EPITAXIAL WAFER FOR LEDS AND METHOD OF MANUFACTURING THE EPITAXIAL WAFER FOR LEDS |
摘要 |
A pattern wafer (10) for LEDs is provided with an uneven structure A (20) having an arrangement with n-fold symmetry substantially on at least a part of the main surface, where in at least a part of the uneven structure A (20), a rotation shift angle Θ meets 0°<Θ≦(180/n)° in which Θ is the rotation shift angle of an arrangement axis A of the uneven structure A (20) with respect to a crystal axis direction in the main surface, and a top of the convex-portion of the uneven structure A (20) is a corner portion with a radius of curvature exceeding “0”. A first semiconductor layer (30), light emitting semiconductor layer (40) and second semiconductor layer (50) are layered on the uneven structure A (20) to constitute an epitaxial wafer (100) for LEDs. It is possible to provide the pattern wafer for LEDs and epitaxial wafer for LEDs with cracks and internal quantum efficiency IQE improved. |
申请公布号 |
US2016149079(A1) |
申请公布日期 |
2016.05.26 |
申请号 |
US201414894480 |
申请日期 |
2014.05.28 |
申请人 |
ASAHI KASEI E-MATERIALS CORPORATION |
发明人 |
KOIKE Jun |
分类号 |
H01L33/20;H01L21/66;H01L33/00 |
主分类号 |
H01L33/20 |
代理机构 |
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代理人 |
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主权项 |
1. A pattern wafer for an LED, comprising:
an uneven structure A having an arrangement with n-fold symmetry substantially on at least a part of a main surface, wherein in at least a part of the uneven structure A, a rotation shift angle Θ meets 0°<Θ≦(180/n)° in which Θ is the rotation shift angle of an arrangement axis A of the uneven structure A relative to a crystal axis direction of the pattern wafer for an LED in the main surface, and a top of the convex-portion of the uneven structure A is a corner portion with a radius of curvature exceeding “0”. |
地址 |
Tokyo JP |