| 发明名称 |
MAGNETIC TUNNEL JUNCTION RESISTANCE COMPARISON BASED PHYSICAL UNCLONABLE FUNCTION |
| 摘要 |
A method includes coupling a first magnetic tunnel junction (MTJ) element and a second MTJ element to a comparison circuit. The method also includes comparing, at the comparison circuit, a first resistance of the first MTJ element to a second resistance of the second MTJ element. The method further includes generating a first physical unclonable function (PUF) output bit based on a result of comparing the first resistance to the second resistance. |
| 申请公布号 |
US2016148666(A1) |
申请公布日期 |
2016.05.26 |
| 申请号 |
US201414555434 |
申请日期 |
2014.11.26 |
| 申请人 |
QUALCOMM Incorporated |
发明人 |
Rosenberg Brian Marc;Zhu Xiaochun;Guo Xu |
| 分类号 |
G11C11/16 |
主分类号 |
G11C11/16 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
coupling a first magnetic tunnel junction (MTJ) element and a second MTJ element to a comparison circuit; comparing, at the comparison circuit, a first resistance of the first MTJ element to a second resistance of the second MTJ element; and generating a first physical unclonable function (PUF) output bit based on a result of comparing the first resistance to the second resistance. |
| 地址 |
San Diego CA US |
