发明名称 |
SEMICONDUCTOR STRUCTURES INCLUDING DIELECTRIC MATERIALS HAVING DIFFERING REMOVAL RATES |
摘要 |
Semiconductor structures may include a stack of alternating dielectric materials and control gates, charge storage structures laterally adjacent to the control gates, a charge block material between each of the charge storage structures and the laterally adjacent control gates, and a pillar extending through the stack of alternating oxide materials and control gates. Each of the dielectric materials in the stack has at least two portions of different densities and/or different rates of removal. Also disclosed are methods of fabricating such semiconductor structures. |
申请公布号 |
US2016148949(A1) |
申请公布日期 |
2016.05.26 |
申请号 |
US201615013298 |
申请日期 |
2016.02.02 |
申请人 |
Micron Technology, Inc. |
发明人 |
Jayanti Srikant;Simsek-Ege Fatma Arzum;Aella Pavan Kumar Reddy |
分类号 |
H01L27/115;H01L29/51;H01L29/788;H01L29/04;H01L29/16 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure, comprising:
a stack of alternating oxide materials and control gates, each of the oxide materials of the stack comprising at least two oxide portions of different densities; charge storage structures laterally adjacent to the control gates; a charge block material between each of the charge storage structures and the respective laterally adjacent control gate; and a pillar extending through the stack of alternating oxide materials and control gates. |
地址 |
Boise ID US |