发明名称 SEMICONDUCTOR STRUCTURES INCLUDING DIELECTRIC MATERIALS HAVING DIFFERING REMOVAL RATES
摘要 Semiconductor structures may include a stack of alternating dielectric materials and control gates, charge storage structures laterally adjacent to the control gates, a charge block material between each of the charge storage structures and the laterally adjacent control gates, and a pillar extending through the stack of alternating oxide materials and control gates. Each of the dielectric materials in the stack has at least two portions of different densities and/or different rates of removal. Also disclosed are methods of fabricating such semiconductor structures.
申请公布号 US2016148949(A1) 申请公布日期 2016.05.26
申请号 US201615013298 申请日期 2016.02.02
申请人 Micron Technology, Inc. 发明人 Jayanti Srikant;Simsek-Ege Fatma Arzum;Aella Pavan Kumar Reddy
分类号 H01L27/115;H01L29/51;H01L29/788;H01L29/04;H01L29/16 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor structure, comprising: a stack of alternating oxide materials and control gates, each of the oxide materials of the stack comprising at least two oxide portions of different densities; charge storage structures laterally adjacent to the control gates; a charge block material between each of the charge storage structures and the respective laterally adjacent control gate; and a pillar extending through the stack of alternating oxide materials and control gates.
地址 Boise ID US