发明名称 |
INTEGRATED DEVICE PACKAGE COMPRISING HETEROGENEOUS SOLDER JOINT STRUCTURE |
摘要 |
Some features pertain to an integrated circuit device that includes a first package substrate, a first die coupled to the first package substrate, a second package substrate, and a solder joint structure coupled to the first package substrate and the second package substrate. The solder joint structure includes a solder comprising a first melting point temperature, and a conductive material comprising a second melting point temperature that is less than the first melting point temperature. In some implementations, the conductive material is one of at least a homogeneous material and/or a heterogeneous material. In some implementations, the conductive material includes a first electrically conductive material and a second material. The conductive material is an electrically conductive material. |
申请公布号 |
US2016148864(A1) |
申请公布日期 |
2016.05.26 |
申请号 |
US201514703617 |
申请日期 |
2015.05.04 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Fu Jie;Rae David Fraser;Aldrete Manuel;Noveski Vladimir;Kim Chin-Kwan |
分类号 |
H01L23/498;H01L23/538;H01L23/00 |
主分类号 |
H01L23/498 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit device comprising:
a first package substrate; a first die coupled to the first package substrate; a second package substrate; and a solder joint structure coupled to the first package substrate and the second package substrate, the solder joint structure comprising:
a solder comprising a first melting point temperature; anda conductive material comprising a second melting point temperature that is less than the first melting point temperature. |
地址 |
San Diego CA US |