发明名称 INTEGRATED DEVICE PACKAGE COMPRISING HETEROGENEOUS SOLDER JOINT STRUCTURE
摘要 Some features pertain to an integrated circuit device that includes a first package substrate, a first die coupled to the first package substrate, a second package substrate, and a solder joint structure coupled to the first package substrate and the second package substrate. The solder joint structure includes a solder comprising a first melting point temperature, and a conductive material comprising a second melting point temperature that is less than the first melting point temperature. In some implementations, the conductive material is one of at least a homogeneous material and/or a heterogeneous material. In some implementations, the conductive material includes a first electrically conductive material and a second material. The conductive material is an electrically conductive material.
申请公布号 US2016148864(A1) 申请公布日期 2016.05.26
申请号 US201514703617 申请日期 2015.05.04
申请人 QUALCOMM Incorporated 发明人 Fu Jie;Rae David Fraser;Aldrete Manuel;Noveski Vladimir;Kim Chin-Kwan
分类号 H01L23/498;H01L23/538;H01L23/00 主分类号 H01L23/498
代理机构 代理人
主权项 1. An integrated circuit device comprising: a first package substrate; a first die coupled to the first package substrate; a second package substrate; and a solder joint structure coupled to the first package substrate and the second package substrate, the solder joint structure comprising: a solder comprising a first melting point temperature; anda conductive material comprising a second melting point temperature that is less than the first melting point temperature.
地址 San Diego CA US