发明名称 X線を利用したオブジェクトの関心領域を解析するための方法及び装置
摘要 A method and a device for analyzing a region of interest in an object is proposed. The method comprises: (a) providing measurement data by a differential phase contrast X-ray imaging system, and (b) analyzing characteristics of the object in the region of interest. Therein, the measurement data comprise a 2-dimensional or 3-dimensional set of pixels wherein for each pixel the measurement data comprises three types of image data spatially aligned with each other, including (i) absorption representing image data A, (ii) differential phase contrast representing image data D, and (iii) coherence representing image data C. The analyzing step is based, for each pixel, on a combination of at least two of information comprised in the absorption representing image data A and information comprised in the differential phase contrast representing image data D and information comprised in the coherence representing image data C.
申请公布号 JP5926281(B2) 申请公布日期 2016.05.25
申请号 JP20130542650 申请日期 2011.12.05
申请人 コーニンクレッカ フィリップス エヌ ヴェKONINKLIJKE PHILIPS N.V. 发明人 カールセン,イングヴァール−クルト;ケーラー,トーマス;マーチン,ゲルハルト;レッスル,エヴァルト;ヴィームカー,ラファエル
分类号 A61B6/00;A61B6/03 主分类号 A61B6/00
代理机构 代理人
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