| 摘要 |
Provided is a semiconductor device, including: an enable generating circuit (10) for generating an enable signal, being a pulse train in synchronization with a clock signal, and supplying the enable signal to a protection target circuit (30); and a first abnormality detecting circuit (20) for detecting an abnormality of clock timing due to introduction of a spike into the clock signal based on comparison between the clock signal and the enable signal generated by the enable generating circuit. Thus, a semiconductor device capable of detecting a local clock abnormality is obtained. |
