发明名称 BEAM INSPECTION SYSTEM AND BEAM INSPECTION METHOD USING THEREFOR
摘要 The present invention relates to a beam inspection system and a beam inspection method using the same. More specifically, the beam inspection system enables a manager to access a central server or directly access a beam inspection device for inspecting the cross section of a beam generated by an accelerator for treatment or research to inspect the cross section of a beam in real time. The beam inspection system includes: the beam inspection device; the central server; and a manager terminal. The beam inspection system, which is an integrated inspection system, can increase accuracy of inspection and easily inspect a beam.
申请公布号 KR20160058533(A) 申请公布日期 2016.05.25
申请号 KR20140160153 申请日期 2014.11.17
申请人 NA, SON YEU 发明人 NA, SON YEU;KIM, MYUNG JIN;KIL, JAE KEUN;JANG, YU SUNG;LEE, DEOG HYEONG;CHO, SU BOK;LEE, SUN HYUNG;KIM, MIN SIK;LEE, YONG JU
分类号 H01J37/08;G01J1/42;H01J27/02 主分类号 H01J37/08
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