发明名称 SOI基板の作製方法
摘要 A bond substrate is irradiated with ions, so that an embrittlement layer is formed, then, the bond substrate is bonded to a base substrate. Next, a part of a region of the bonded bond substrate is heated at a temperature higher than a temperature of the other part of the region of the bond substrate, or alternatively, a first heat treatment is performed on the bonded bond substrate as a whole at a first temperature; and a second heat treatment is performed on a part of a region of the bonded bond substrate at a second temperature higher than the first temperature, so that separation of the bond substrate proceeds from the part of the region of the bond substrate to the other part of the region of the bond substrate in the embrittlement layer. Accordingly, a semiconductor layer is formed over the base substrate.
申请公布号 JP5926887(B2) 申请公布日期 2016.05.25
申请号 JP20110017410 申请日期 2011.01.31
申请人 株式会社半導体エネルギー研究所 发明人 奥野 直樹;徳永 肇
分类号 H01L21/02;H01L21/265;H01L27/12 主分类号 H01L21/02
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