| 摘要 |
The present invention relates to a test system for performing a test operation. The test system comprises a vector storage part for storing a first test vector corresponding to a first test operation, a test object part for performing a test operation corresponding to a test vector stored in the vector storage part, a result comparison part for outputting a test result value by comparing an expected value and the output signal of the test object part, and a vector control part for changing the first test vector into a second test vector corresponding to the second test operation by controlling the first test vector. So, the test operation can be carried out on various test object circuits. |
