发明名称 PROPERTY MEASUREMENT METHOD FOR SOLAR PANEL, AND DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To measure properties of a solar panel in a shorter time.SOLUTION: A property measurement device comprises: a voltage detection part 110 including voltage sensors 111 and 112 connected to a (p) terminal and a (n) terminal of a solar cell train 10 that is formed by connecting a plurality of pn junction type solar cells in series; a switch 113 for short-circuiting or open-circuiting the voltage sensors 111 and 112; and a current detection part 120 for detecting a current that flows in the solar cell train 10. While PCS (maximum output point followup means) is operated and a breaker 20 is in a "ON" state, the switch 113 is opened and a maximum output operation voltage Vpm between the (p) terminal and the (n) terminal and a maximum output operation current Ipm of the solar cell train 10 are measured. While turning "off" the breaker 20 and opening the switch 113, the (p) terminal and (n) terminal are open-circuited and an open-circuit voltage Voc is measured. While turning off the breaker 20 and "closing" the switch, the (p) terminal and the (n) terminal are short-circuited and a short-circuit current Isc is obtained. The properties of the solar cell train are measured on the basis of the maximum output operation voltage Vpm, the maximum output operation current Ipm, the open-circuit voltage Voc and the short-circuit current Isc.SELECTED DRAWING: Figure 2
申请公布号 JP2016086573(A) 申请公布日期 2016.05.19
申请号 JP20140219006 申请日期 2014.10.28
申请人 HIOKI EE CORP 发明人 YAMAZAKI AKIRA;KOBAYASHI KENJI;HIGUCHI MASAO
分类号 H02S50/10;G01R31/26;G05F1/67 主分类号 H02S50/10
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