发明名称 STACKED SEMICONDUCTOR DIE ASSEMBLIES WITH IMPROVED THERMAL PERFORMANCE AND ASSOCIATED SYSTEMS AND METHODS
摘要 Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods are disclosed herein. In one embodiment, a semiconductor die assembly can include a stack of semiconductor dies and a thermally conductive casing at least partially enclosing the stack of semiconductor dies within an enclosure. A package substrate carries the thermally conductive casing, and an interposer is disposed between the thermally conductive casing and the stack of semiconductor dies. A peripheral portion of the interposer extends laterally beyond the stack of semiconductor dies and is coupled to a plurality of conductive members interposed between the peripheral portion and the package substrate.
申请公布号 US2016141270(A1) 申请公布日期 2016.05.19
申请号 US201615007615 申请日期 2016.01.27
申请人 Micron Technology, Inc. 发明人 Koopmans Michel;Luo Shijian;Hembree David R.
分类号 H01L25/065;H01L23/373;H01L25/00;H01L23/522 主分类号 H01L25/065
代理机构 代理人
主权项 1. A semiconductor die assembly, comprising: a thermally conductive casing; a package substrate, wherein the package substrate and the thermally conductive casing together define an enclosure; an interposer attached to the thermally conductive casing within the enclosure; and a stack of semiconductor dies disposed between the interposer and the package substrate within the enclosure.
地址 Boise ID US