发明名称 |
STACKED SEMICONDUCTOR DIE ASSEMBLIES WITH IMPROVED THERMAL PERFORMANCE AND ASSOCIATED SYSTEMS AND METHODS |
摘要 |
Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods are disclosed herein. In one embodiment, a semiconductor die assembly can include a stack of semiconductor dies and a thermally conductive casing at least partially enclosing the stack of semiconductor dies within an enclosure. A package substrate carries the thermally conductive casing, and an interposer is disposed between the thermally conductive casing and the stack of semiconductor dies. A peripheral portion of the interposer extends laterally beyond the stack of semiconductor dies and is coupled to a plurality of conductive members interposed between the peripheral portion and the package substrate. |
申请公布号 |
US2016141270(A1) |
申请公布日期 |
2016.05.19 |
申请号 |
US201615007615 |
申请日期 |
2016.01.27 |
申请人 |
Micron Technology, Inc. |
发明人 |
Koopmans Michel;Luo Shijian;Hembree David R. |
分类号 |
H01L25/065;H01L23/373;H01L25/00;H01L23/522 |
主分类号 |
H01L25/065 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor die assembly, comprising:
a thermally conductive casing; a package substrate, wherein the package substrate and the thermally conductive casing together define an enclosure; an interposer attached to the thermally conductive casing within the enclosure; and a stack of semiconductor dies disposed between the interposer and the package substrate within the enclosure. |
地址 |
Boise ID US |