发明名称 SEMICONDUCTOR ELEMENT CLEANING SOLUTION THAT SUPPRESSES DAMAGE TO COBALT, AND METHOD FOR CLEANING SEMICONDUCTOR ELEMENT USING SAME
摘要 According to the present invention, it is possible to provide a cleaning solution which removes a dry etching residue on a surface of a semiconductor element that includes: (1) a material containing cobalt or a cobalt alloy or (2) a material containing cobalt or a cobalt alloy and tungsten; and an insulating film between low dielectric constant layers. The cleaning solution contains 0.001-7 mass % of an alkali metal compound, 0.005-35 mass % of a peroxide, 0.005-10 mass % of an anti-corrosion agent, 0.000001-1 mass % of an alkaline earth metal compound, and water.
申请公布号 WO2016076033(A1) 申请公布日期 2016.05.19
申请号 WO2015JP78077 申请日期 2015.10.02
申请人 MITSUBISHI GAS CHEMICAL COMPANY, INC. 发明人 OIE TOSHIYUKI;SHIMADA KENJI
分类号 H01L21/304;C11D7/06;C11D7/10;C11D7/18;C11D7/32;C11D7/38 主分类号 H01L21/304
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