| 摘要 |
The invention relates to a method for determining the adhesiveness of layers on substrates, wherein a series of arrangements (17, 17', 17", 17"') is formed in the layer (14), wherein each arrangement comprises at least two mutually assigned structures (13, 16; 23) which are formed in the layer (14), wherein an adhesive imprint that causes cracks in the layer is brought about by at least one of the at least two structures and/or the inner lateral cohesion in the layer is locally eliminated or at least weakened, wherein the individual arrangements differ from one another in that, for each arrangement, a spacing (d; D) between the mutually assigned structures (13, 16; 23) that is different in each case is selected, and wherein the greatest spacing at which the associated arrangement contains the intermediate zone arranged between the mutually assigned structures is determined as a measure of the adhesiveness of the layer. |
