发明名称 |
CHARGED PARTICLE BEAM IRRADIATION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a charged particle beam irradiation device capable of securing a sufficient irradiation field while being capable of suppressing being large-sized.SOLUTION: A charged particle beam irradiation device according to an embodiment comprises: a first scan electromagnet unit for deflecting a charged particle beam in a second direction substantially orthogonal to a first direction that is the charged particle beam's incident direction; and a second scan electromagnet unit for deflecting the charged particle beam in a third direction substantially orthogonal to the first and second directions. The first and second scan electromagnet units are arranged in parallel with the first direction.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016083344(A) |
申请公布日期 |
2016.05.19 |
申请号 |
JP20150117703 |
申请日期 |
2015.06.10 |
申请人 |
NATL INST OF RADIOLOGICAL SCIENCES;TOSHIBA CORP |
发明人 |
FURUKAWA TAKUJI;TAKAYAMA SHIGEKI;YAZAWA TAKASHI;KANAI YOSHIHARU;SATO KOSUKE;ORIGASA TOMOFUMI;KOYANAGI KEI |
分类号 |
A61N5/10;G21K1/087;G21K5/00;G21K5/04 |
主分类号 |
A61N5/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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