发明名称 CHARGED PARTICLE BEAM IRRADIATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam irradiation device capable of securing a sufficient irradiation field while being capable of suppressing being large-sized.SOLUTION: A charged particle beam irradiation device according to an embodiment comprises: a first scan electromagnet unit for deflecting a charged particle beam in a second direction substantially orthogonal to a first direction that is the charged particle beam's incident direction; and a second scan electromagnet unit for deflecting the charged particle beam in a third direction substantially orthogonal to the first and second directions. The first and second scan electromagnet units are arranged in parallel with the first direction.SELECTED DRAWING: Figure 1
申请公布号 JP2016083344(A) 申请公布日期 2016.05.19
申请号 JP20150117703 申请日期 2015.06.10
申请人 NATL INST OF RADIOLOGICAL SCIENCES;TOSHIBA CORP 发明人 FURUKAWA TAKUJI;TAKAYAMA SHIGEKI;YAZAWA TAKASHI;KANAI YOSHIHARU;SATO KOSUKE;ORIGASA TOMOFUMI;KOYANAGI KEI
分类号 A61N5/10;G21K1/087;G21K5/00;G21K5/04 主分类号 A61N5/10
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