| 摘要 |
Provided is an atomic absorption photometer and an atomic absorption measurement method which can easily perform background correction in a short time using a plurality of types of methods, while suppressing the amount of samples consumed. Background correction is performed by each of the D2 lamp method, the Zeeman method, and a self-reversal method on the basis of measurement data obtained in each of measurement periods T41-T46 in one data acquisition cycle. Background correction is performed on common measurement data (atom absorption data) obtained in the atomic absorption measurement period T41 using each of the measurement data (background data) obtained in first to third background measurement periods T44, T46, T42. |
