发明名称 CERTIFIED WAFER INSPECTION
摘要 A method for certifying an inspection system using a calibrated surface, comprising: acquiring a calibrated list from said calibrated surface, with said calibrated list comprising information about features located on said calibrated surface; inspecting said calibrated surface with said inspection system to generate an estimated list, with said estimated list comprising information about features located on said calibrated surface; generating a matched list by searching for the presence of one or more calibrated features in said estimated list, wherein said calibrated features are listed in said calibrated list; computing an estimated characteristic parameter from said matched list, wherein said estimated characteristic parameter quantifies features in said matched list having a unifying characteristic; and comparing said estimated characteristic parameter with a calibrated characteristic parameter, wherein said calibrated characteristic parameter quantifies features in said calibrated list having said unifying characteristic, whereby the ability of said inspection system to detect features with one or more characteristics is certified. A system and method for imaging a surface to generate an adaptive resolution image, comprising: determining a weakly scattering feature, wherein said weakly scattering feature produces a weak image response to be resolved by said adaptive resolution image; determining a coarse spot size such that said weakly scattering feature is detected in an image captured with said coarse spot size; capturing a coarse image of region with said coarse spot size, wherein said coarse image of region comprises one or more pixels corresponding to a predetermined region of said surface; classifying said coarse image of region into a coarse image of feature and a coarse image of surface, wherein a feature is detected in said coarse image of feature and a feature is not detected in said coarse image of surface; estimating a feature position from said coarse image of feature, wherein said feature position is the location of feature on said surface; capturing a fine image of feature at said feature position, wherein said fine image of feature is captured with a fine spot size having a smaller spot size than said coarse spot size; and combining said fine image of feature and said coarse image of surface to generate said adaptive resolution image, whereby feature regions are captured with finer resolution than featureless surface regions in said adaptive resolution image.
申请公布号 US2016141146(A1) 申请公布日期 2016.05.19
申请号 US201414547111 申请日期 2014.11.18
申请人 Pavani Sri Rama Prasanna 发明人 Pavani Sri Rama Prasanna
分类号 H01J37/26;H01J37/22;H01J37/20 主分类号 H01J37/26
代理机构 代理人
主权项 1. A method for calibrating an inspection system using a calibrated surface, comprising: capturing a calibrated list from said calibrated surface, with said calibrated list comprising information about features located on said calibrated surface; capturing an estimated list from calibrated surface with said inspection system, with said estimated list comprising information about features located on said calibrated surface; compiling a matched list by searching for the presence of one or more calibrated features in said estimated list, wherein said calibrated features are listed in said calibrated list; computing an estimated characteristic parameter from said matched list, wherein said estimated characteristic parameter quantifies features in said matched list having a unifying characteristic;computing a calibrated characteristic parameter, wherein said calibrated characteristic parameter quantifies features in said calibrated list having said unifying characteristic; and computing a comparison of said estimated characteristic parameter with said calibrated characteristic parameter, whereby said inspection system is calibrated to detect features with one or more unifying characteristics.
地址 Palo Alto CA US