发明名称 |
X-RAY DEVICE AND MANUFACTURING METHOD OF STRUCTURE |
摘要 |
Provided is a device capable of suppressing a drop in detection accuracy, and a manufacturing method of a structure. A detection device is a device that irradiates a subject with X-rays and detects the X-rays transmitting through the subject, and includes an X-ray source that emits X-rays, a table that holds the subject, a detector that detects at least a portion of the transmitted X-rays emitted from the X-ray source and transmitted through the subject, and a first guide device and a second guide device that guide movement of the table in a direction parallel to an optical axis of the X-ray source while supporting the table. In this detection device, a guide plane, which is parallel to the optical axis and is a plane to which the movement of the table is regulated, passes through the inside of a detection region of the transmitted X-rays of the detector. |
申请公布号 |
US2016139064(A1) |
申请公布日期 |
2016.05.19 |
申请号 |
US201514935837 |
申请日期 |
2015.11.09 |
申请人 |
NIKON CORPORATION ;NIKON METROLOGY NV |
发明人 |
WATANABE Takashi;HILTON Daniel;HAWKER Sam |
分类号 |
G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
1. An X-ray device configured to irradiate a measurement object with X-rays and detect X-rays transmitted through the measurement object, the device comprising:
an X-ray source configured to emit X-rays from a light emission point; a stage configured to support the measurement object; a detector configured to detect at least a portion of transmitted X-rays that have been emitted from the X-ray source and transmitted through the measurement object; a movement device configured to move one of the X-ray source, the stage, or the detector in a first direction as a mobile object in order to change at least one of a distance between the light-emission point and the measurement object or a distance between the light-emission point and the detector; and a first measurement device and a second measurement device each configured to measure a position of the mobile object in the first direction, the first measurement device and the second measurement device being disposed along a second direction orthogonal to the first direction in a mobile region of the movement device. |
地址 |
Tokyo JP |