发明名称 |
SUBSTRATE CLEANING APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE CLEANING METHOD |
摘要 |
A substrate cleaning apparatus capable of removing fine particles from a substrate, such as a wafer, without using a chemical liquid is disclosed. The substrate cleaning apparatus includes: a substrate supporting structure for supporting the substrate; a vibration device secured to the substrate supporting structure; a vibration controller configured to cause the vibration device to vibrate at a natural frequency of the substrate; and a cleaning liquid supply nozzle configured to supply a cleaning liquid onto the substrate. |
申请公布号 |
US2016136775(A1) |
申请公布日期 |
2016.05.19 |
申请号 |
US201514940741 |
申请日期 |
2015.11.13 |
申请人 |
EBARA CORPORATION |
发明人 |
Shinozaki Hiroyuki |
分类号 |
B24B37/20;B08B3/12;B08B3/02 |
主分类号 |
B24B37/20 |
代理机构 |
|
代理人 |
|
主权项 |
1. A substrate cleaning apparatus comprising:
a substrate supporting structure configured to support a substrate; a vibration device secured to the substrate supporting structure; a vibration controller configured to cause the vibration device to vibrate at a natural frequency of the substrate; and a cleaning liquid supply nozzle configured to supply a cleaning liquid onto the substrate. |
地址 |
Tokyo JP |