发明名称 SUBSTRATE CLEANING APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE CLEANING METHOD
摘要 A substrate cleaning apparatus capable of removing fine particles from a substrate, such as a wafer, without using a chemical liquid is disclosed. The substrate cleaning apparatus includes: a substrate supporting structure for supporting the substrate; a vibration device secured to the substrate supporting structure; a vibration controller configured to cause the vibration device to vibrate at a natural frequency of the substrate; and a cleaning liquid supply nozzle configured to supply a cleaning liquid onto the substrate.
申请公布号 US2016136775(A1) 申请公布日期 2016.05.19
申请号 US201514940741 申请日期 2015.11.13
申请人 EBARA CORPORATION 发明人 Shinozaki Hiroyuki
分类号 B24B37/20;B08B3/12;B08B3/02 主分类号 B24B37/20
代理机构 代理人
主权项 1. A substrate cleaning apparatus comprising: a substrate supporting structure configured to support a substrate; a vibration device secured to the substrate supporting structure; a vibration controller configured to cause the vibration device to vibrate at a natural frequency of the substrate; and a cleaning liquid supply nozzle configured to supply a cleaning liquid onto the substrate.
地址 Tokyo JP
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