发明名称 INTERNAL TEMPERATURE MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an internal temperature measurement device capable of more precisely measuring internal temperature of a measurement target with a quick response, where the heat resistance value of a non-heat generation body positioned at the surface side is unknown.SOLUTION: An internal temperature measurement device 10 includes: two cells 20a and 20b measuring two heat fluxes to calculate internal temperature of a measurement target which has unknown heat resistance value in a non-heat generation body; and an MEMS chip 12 which has cells 20c for increasing the difference in the heat flux.SELECTED DRAWING: Figure 4
申请公布号 JP2016085136(A) 申请公布日期 2016.05.19
申请号 JP20140218441 申请日期 2014.10.27
申请人 OMRON CORP 发明人 NAKAGAWA SHINYA;SHIMIZU MASAO;HAMAGUCHI TSUYOSHI
分类号 G01K7/00 主分类号 G01K7/00
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