发明名称 CLEANING LIQUID FOR SEMICONDUCTOR DEVICE SUBSTRATE AND CLEANING METHOD FOR SEMICONDUCTOR DEVICE SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a cleaning liquid and a cleaning method which are used in a cleaning step on a semiconductor device substrate, especially a semiconductor device substrate having, on its surface, metal wiring or cobalt for a barrier metal after CMP step, and which enables the achievement of adequate anticorrosion for the metal wiring or barrier metal and the achievement of the satisfactory cleaning of a substrate surface.SOLUTION: A cleaning liquid for a semiconductor device substrate comprises the following components (A)-(D), and is pH8 or higher: (A)a compound expressed by the general formula (1); (B)at least one compound selected from a group consisting of adenine, purine, guanine, hypoxanthine, xanthine, theobromine, caffeine, uric acid, isoguanine, and their derivatives; (C)a pH adjuster; and (D)water.SELECTED DRAWING: None
申请公布号 JP2016086094(A) 申请公布日期 2016.05.19
申请号 JP20140218461 申请日期 2014.10.27
申请人 MITSUBISHI CHEMICALS CORP 发明人 SHIBATA TOSHIAKI;ITO ATSUSHI;MIZUTANI BUNICHI
分类号 H01L21/304;C11D7/26;C11D7/32;C11D17/08 主分类号 H01L21/304
代理机构 代理人
主权项
地址